Scanning probe microscopies II : 18-19 January 1993, Los Angeles, California /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Williams, Clayton C. (Clayton Covey)
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1993]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 1855.
Subjects:	Scanning electron microscopes > Congresses. Probes (Electronic instruments) > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/1855.toc

Description
Physical Description:	ix, 220 pages : illustrations ; 28 cm.
Bibliography:	Includes bibliographical references and index.
ISBN:	0819410810 (pbk.)