Cover Image

Electromigration and electronic device degradation /

Bibliographic Details
Other Authors: Christou, A.
Format: Book
Language:English
Published: New York, NY, USA : Wiley, [1994]
Subjects:
Integrated circuits > Deterioration.
Semiconductors > Failures.
Electrodiffusion.
Description
Item Description:"A Wiley-Interscience publication"
Physical Description:343 pages : illustrations
Bibliography:Includes bibliographical references and index.
ISBN:0471584894 (cloth : alk. paper)