Tenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : February 1-3, 1994, Red Lion Hotel, San Jose, CA, USA /

Bibliographic Details
Corporate Authors: IEEE Semiconductor Thermal Measurement and Management Symposium San Jose, Calif., Components, Packaging & Manufacturing Technology Society
Format: Conference Proceeding Book
Language:English
Published: New York, NY, U.S.A. : Piscataway, NJ, USA : IEEE ; May be purchased from the IEEE Service Center, [1994]
Subjects:
Description
Item Description:"IEEE catalog number 94CH3413-2"--Title page verso.
"SEMI-THERM X"--P. iii.
Physical Description:xi, 180 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references.
ISBN:0780318536 (casebound)