Multilayer and grazing incidence X-ray/EUV optics II : 14-16 July 1993, San Diego, California /
| Corporate Author: | |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
[1994]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 2011. |
| Subjects: | |
| Online Access: | https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/2011.toc |
| Physical Description: | xiii, 592 pages : illustrations ; 28 cm. |
|---|---|
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0819412600 (pbk.) |