X-ray and ultraviolet polarimetry : 15-16 July 1993, San Diego, California /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Fineschi, Silvano
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1994]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 2010.
Subjects:
Description
Physical Description:x, 230 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819412597 (pbk.)