Cover Image

X-ray detector physics and applications II : 13-14 July 1993, San Diego, California /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Orphan, V. J.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1993]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 2009.
Subjects:
X-rays > Instruments > Congresses.
X-rays > Instruments > Industrial applications > Congresses.
Description
Physical Description:ix, 274 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819412589 (pbk.)