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Proceedings, International Test Conference, 1993.

Bibliographic Details
Corporate Authors:	International Test Conference, Institute of Electrical and Electronics Engineers
Format:	Conference Proceeding Book
Language:	English
Published:	Altoona, PA : Piscataway, NJ : International Test Conference ; [distributor] IEEE Service Center, ©1993.
Subjects:	Integrated circuits > Testing > Congresses. Automatic test equipment > Congresses. Semiconductors > Testing > Congresses. Équipement d'essai automatique > Congrès. Semi-conducteurs > Essais > Congrès. Automatic test equipment. Integrated circuits > Testing. Semiconductors > Testing. Circuits intégrés > Essais > Congrès. Conference papers and proceedings.

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