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Proceedings, International Test Conference, 1993.

Bibliographic Details
Corporate Authors: International Test Conference, Institute of Electrical and Electronics Engineers
Format: Conference Proceeding Book
Language:English
Published: Altoona, PA : Piscataway, NJ : International Test Conference ; [distributor] IEEE Service Center, ©1993.
Subjects:
Integrated circuits > Testing > Congresses.
Automatic test equipment > Congresses.
Semiconductors > Testing > Congresses.
Équipement d'essai automatique > Congrès.
Semi-conducteurs > Essais > Congrès.
Automatic test equipment.
Integrated circuits > Testing.
Semiconductors > Testing.
Circuits intégrés > Essais > Congrès.
Conference papers and proceedings.
Description
Item Description:"IEEE catalog number 93CH3356-3"--Title page verso.
"IEEE Computer Society press order number 4192-02"--Title page verso.
Cover and spine title: 1993 IEEE International Test Conference.
Physical Description:xii, 1065 pages : illustrations ; 29 cm
Bibliography:Includes bibliographical references and index.
ISBN:0780314301
9780780314306
0780314298
9780780314290
078031431X
9780780314313