Ion and photon emission from keV cluster impacts on surfaces /

Secondary ion emission under keV carbon cluster bombardment /
by: Locklear, Jay Edward, 1977-
Published: (2006)

Materials processing by cluster ion beams : history, technology, and applications /
by: Yamada, I. (Isao)
Published: (2016)

Ion surface interaction, sputtering and related phenomena /
Published: (1973)

Introduction to Ion beam biotechnology /
by: Yu, Zengliang
Published: (2006)

Cluster secondary ion mass spectrometry : principles and applications /
by: Mahoney, Christine M., 1975-
Published: (2013)

Ion formation from organic solids (IFOS III) : mass spectrometry of involatile material : proceedings of the third international conference, Munster, Fed. Rep. of Germany, September 16-18, 1985 /
Published: (1986)

Surface mapping based on the correlated emission of ions and electrons from hypervelocity C₆₀ impacts /
by: Eller, Michael J.
Published: (2013)

Ion formation from organic solids : proceedings of the second international conference, Munster, Fed. Rep. of Germany, September 7-9, 1982 /
Published: (1983)

Ion Beam Processing of Materials and Deposition Processes of Protective Coatings : Proceedings of Symposium C, Symposium J and Symposium H of the 1995 E-Mrs Spring Conference, Strasbourg, France, May 22-26, 1995 /
Published: (1996)

Ion formation from organic solids (IFOS V) : proceedings of the fifth international conference, Lövånger, Sweden, June 18-21, 1989 /
Published: (1990)

Ion formation from organic solids (IFOS IV) : mass spectrometry of involatile material : proceedings of the fourth international conference, Münster, Federal Republic of Germany, September 21-23, 1987 /
Published: (1989)

Cluster ions /
by: Ng, C. Y. (Cheuk-Yiu), 1947-
Published: (1993)

The development of high-intensity negative ion sources and beams in the USSR /
by: Wells, Nikita, 1937-
Published: (1981)

Surface modification of metals by ion beams--7 : proceedings of the Seventh International Conference on Surface Modification of Metals by Ion Beams, Washington, DC, July 14-19, 1991 /
Published: (1992)

Heavy ion accelerator technology : eighth international conference : Argonne, Illinois, October 1998 /
Published: (1999)

Ion beam applications in surface and bulk modification of insulators.
Published: (2008)

Ion-induced electron emission from crystalline solids /
by: Kudō, Hiroshi, 1947-
Published: (2002)

Ion implantation : a bibliography /
by: Morgan, R.
Published: (1972)

Ion implantation and ion beam equipment : proceedings of the international conference, Elenite, Bulgaria, September 24-30, 1990 /
Published: (1991)

Ion beam analysis : fundamentals and applications /
by: Nastasi, Michael Anthony, 1950-, et al.
Published: (2015)

Large ion beams : fundamentals of generation and propagation /
by: Forrester, A. Theodore
Published: (1988)

High-power ion beams /
by: Bystrit͡skiĭ, V. M. (Vitaliĭ Mikhaĭlovich)
Published: (1989)

Secondary ion mass spectrometry : principles and applications /
Published: (1989)

Principles and applications of high-energy ion microbeams /
Published: (1987)

Physics of ion impact phenomena /
Published: (1991)

Handbook of ion beam processing technology : principles, deposition, film modification, and synthesis /
Published: (1989)

Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications, and trends /
by: Benninghoven, A.
Published: (1987)

Secondary ion mass spectrometry : a practical handbook for depth profiling and bulk impurity analysis /
by: Wilson, Robert G.
Published: (1989)

Electron and ion emission from solids /
by: Jenkins, R. O. (Ronald Osmond)
Published: (1965)

Cluster beam deposition of functional nanomaterials and devices /
Published: (2020)

Focused ion beams from liquid metal ion sources /
by: Prewett, P. D. (Philip Doughty), 1948-
Published: (1991)

Secondary ion mass spectrometry : SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985 /
Published: (1986)

Secondary ion mass spectrometry, SIMS-II : proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979 /
Published: (1979)

Ion beam analysis : proceedings of the fourth International Conference on Ion Beam Analysis, Aarhus, June 25-29, 1979 /
Published: (1980)

Ion implantation and beam processing /
Published: (1984)

Low-energy ion beams, 1977 : invited and contributed papers presented at the International Conference on Low-energy Ion Beams held at the University of Salford, 5-8 September 1977 /
Published: (1978)