Cover Image

Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A. /

Bibliographic Details
Other Authors: Rodbell, Kenneth P.
Format: Book
Language:English
Published: Pittsburgh, Penn. : Materials Research Society, [1993]
Series:Materials Research Society symposia proceedings.
Subjects:
Microelectronics > Reliability > Congresses.
Microelectronics > Materials > Testing > Congresses.
Electrodiffusion > Congresses.
Microstructure > Congresses.
Description
Physical Description:xi, 497 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and indexes.
ISBN:1558992057
ISSN:0272-9172 ;