rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Materials reliability in microelectronics II
    sub title: symposium held April 27-May 1, 1992, San Francisco, California, U.S.A
  title info:
    title: Materials reliability in microelectronics 2
  title info:
    title: Materials reliability in microelectronics two
  name:
    name part: Thompson, C. V. (Carl V.)
  name:
    name part: Lloyd, J. R. (James R.)
  type of resource: text
  genre: bibliography
  genre: conference publication
  origin info:
    place:
      place term: pau
    date issued: 1992
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: ix, 328 pages : illustrations ; 24 cm.
  note: editors, C.V. Thompson, J.R. Lloyd.
  note: Includes bibliographical references and index.
  subject:
    topic: Microelectronics
    topic: Reliability
    topic: Congresses
  subject:
    topic: Microelectronics
    topic: Materials
    topic: Testing
    topic: Congresses
  subject:
    topic: Electrodiffusion
    topic: Congresses
  subject:
    topic: Microstructure
    genre: Congresses
  classification: TK7874 .M3442 1992
  classification: 621.381
  related item:
    title info:
      title: Materials Research Society symposia proceedings
  identifier: 1558991603
  identifier: 92027362
  record info:
    record content source: DLC
    record creation date: 920708
    record change date: 20151001063303.0
    record identifier: in00001153044