Second International Symposium on Measurement Technology and Intelligent Instruments : 29 October-5 November 1993, Wuhan, China /
| Corporate Authors: | , |
|---|---|
| Other Authors: | , , |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
[1993]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 2101. |
| Subjects: |
| Physical Description: | 2 volumes (xxi, 1464 pages) : illustrations ; 28 cm. |
|---|---|
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0819413844 (pbk.) |