rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: VLSI fault modeling and testing techniques
  name:
    name part: Zobrist, George W. (George Winston)
    name part: 1934-
  type of resource: text
  genre: bibliography
  origin info:
    place:
      place term: nju
    date issued: 1993
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: vii, 199 pages : illustrations ; 24 cm.
  note: edited by George W. Zobrist.
  note: Includes bibliographical references and indexes.
  subject:
    topic: Integrated circuits
    topic: Very large scale integration
    topic: Testing
    topic: Data processing
  subject:
    topic: Fault-tolerant computing
  classification: TK7874 .V5625 1993
  classification: 621.39/5
  related item:
    title info:
      title: VLSI design automation series
  identifier: 0893917818 (cl)
  identifier: 92023433
  record info:
    record content source: DLC
    record creation date: 920717
    record change date: 20150930095106.0
    record identifier: in00001147179