Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : February 2-4, 1993, Four Seasons Hotel, Austin, TX, USA.
| Corporate Authors: | , |
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| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
New York, NY, U.S.A. (345 E. 47th St., New York, NY 10017 U.S.A.) : Piscataway, NJ :
IEEE ; Additional copies from IEEE Service Center,
[1993]
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| Subjects: |
| Item Description: | Sponsored by the IEEE Components, Hybrids, and Manufacturing Technology Society. "IEEE catalog number 93CH3226-8"--Title page verso. |
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| Physical Description: | x, 214 pages : illustrations ; 28 cm. |
| Bibliography: | "1993 cumulative bibliography of articles on semiconductor thermal and temperature testing" / compiled by Bernard Siegal: pages 194-211. Includes bibliographical references. |
| ISBN: | 0780308646 (casebound) 0780308638 (softbound) 0780308654 (microfiche) |