LSI: the basic module for new communication networks /

Memory & LSI : digest of papers /
Published: (1977)

Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE.
Published: (1974)

Design & test techniques for VLSI & WSI circuits /
Published: (1989)

Digital MOS integrated circuits /
Published: (1981)

2001 proceedings : Eighteenth International VLSI Multilevel Interconnection Conference (VMIC), September 25-26, 2001, Santa Clara Marriott Hotel, Santa Clara, CA.
Published: (2001)

Rapid reliability assessment of VLSICs /
Published: (1990)

VLSI test principles and architectures : design for testability /
Published: (2006)

Self-testing VLSI design /
by: I͡Armolik, V. N. (Vi͡acheslav Nikolaevich)
Published: (1993)

Digital system design with LSI bit-slice logic /
by: Myers, Glenford J., 1946-
Published: (1980)

Frontiers of characterization and metrology for nanoelectronics : 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Albany, New York, 11-15 May 2009 /
Published: (2009)

Tutorial : LSI testing /
Published: (1978)

Basic VLSI design technology : technical questions and solutions /
by: Bhargava, Cherry, 1982-, et al.
Published: (2020)

LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey /
Published: (1979)

Hierarchical modeling for VLSI circuit testing /
by: Bhattacharya, Debashis, 1961-
Published: (1990)

Characterization and metrology for ULSI technology, 2000 : international conference, Gaithersburg, Maryland, 26-29 June 2000 /
Published: (2001)

Characterization and metrology for ULSI technology : 2003 International Conference on Characterization and Metrology for ULSI Technology, Austin, Texas, 24-28 March 2003 /
Published: (2003)

Characterization and metrology for ULSI technology : Richardson, Texas, 15-18 March 2005 /
Published: (2005)

Characterization and metrology for ULSI technology : 1998 international conference, Gaithersburg, Maryland, March 1998 /
Published: (1998)

From contamination to defects, faults, and yield loss : simulation and applications /
by: Khare, Jitendra B.
Published: (1996)

Large scale integration /
Published: (1976)

Large scale integration : devices, circuits, and systems /
Published: (1981)

Basic VLSI design : principles and applications /
by: Pucknell, Douglas A., 1927-
Published: (1985)

Basic VLSI design : systems and circuits /
by: Pucknell, Douglas A., 1927-
Published: (1988)

Broadband circuits for optical fiber communication /
by: Säckinger, Eduard, 1959-
Published: (2005)

Basic ESD and I/O design /
by: Dabral, Sanjay
Published: (1998)

ULSI technology /
Published: (1996)

VLSI planarization : methods, models, implementation /
by: Feinberg, V.
Published: (1997)

The bounding approach to VLSI circuit simulation /
by: Zukowski, Charles A.
Published: (1986)

Mixed analog-digital VLSI devices and technology : an introduction /
by: Tsividis, Yannis
Published: (1996)

VLSI electronics : microstructure science, volume 7 /
Published: (1983)

Design automation, languages, and simulations /
Published: (2003)

Unified methods for VLSI simulation and test generation /
by: Cheng, Kwang-Ting, 1961-
Published: (1989)

Genetic algorithms for VLSI design, layout & test automation /
by: Mazumder, Pinaki
Published: (1999)

Power-constrained testing of VLSI circuits /
by: Nicolici, Nicola
Published: (2003)

Power-constrained testing of VLSI circuits /
by: Nicolici, Nicola
Published: (2003)

Top-down digital VLSI design : from architectures to gate-level circuits and FPGAs /
by: Kaeslin, Hubert
Published: (2014)