1991 proceedings /

Bibliographic Details
Corporate Authors: International Conference on Wafer Scale Integration San Francisco, Calif., IEEE Computer Society, IEEE Components, Hybrids, and Manufacturing Technology Society
Other Authors: Little, Michael J., Jain, Vijay K.
Format: Conference Proceeding Book
Language:English
Published: Los Alamitos, Calif. : The Society, [1991]
Subjects:

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