Cover Image

1991 proceedings /

Bibliographic Details
Corporate Authors: International Conference on Wafer Scale Integration San Francisco, Calif., IEEE Computer Society, IEEE Components, Hybrids, and Manufacturing Technology Society
Other Authors: Little, Michael J., Jain, Vijay K.
Format: Conference Proceeding Book
Language:English
Published: Los Alamitos, Calif. : The Society, [1991]
Subjects:
Integrated circuits > Wafer-scale integration > Congresses.
Description
Item Description:Cover title: 1991 IEEE International Conference on Wafer Scale Integration.
"IEEE catalog number 91CH2943-9."
Physical Description:xiv, 342 pages : illustrations ; 23 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0818691263 (case)
0780300807 (lib. bdg.)
0818661267 (microfiche)