Cover Image

Scanning electron microscopy and X-Ray microanalysis /

Bibliographic Details
Main Author: Lee, Robert Edward
Format: Book
Language:English
Published: Englewood Cliffs, N.Y. : Prentice Hall, [1993]
Subjects:
Scanning electron microscopy.
X-ray microanalysis.
Electron Probe Microanalysis.
Microscopy, Electron, Scanning.
Description
Physical Description:xiii, 458 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0138137595