rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Conference record
    sub title: IEEE Instrumentation and Measurement Technology Conference, May 12-14, 1992, Meadowlands Hilton Hotel, metropolitan New York, USA
  title info:
    title: IMTC '92
  title info:
    title: Instrumentation and measurement technology conference, 1992, IMTC '92, 9th IEEE
  name:
    name part: IEEE Instrumentation and Measurement Technology Conference (1992 : East Rutherford, N.J.)
    role:
      role term: creator
  name:
    name part: IEEE Instrumentation and Measurement Society
  name:
    name part: IEEE North Jersey Section
  name:
    name part: IEEE Instrumentation and Measurement Society
    name part: New York/New Jersey/Long Island Chapter.
  type of resource: text
  genre: bibliography
  genre: conference publication
  genre: Conference papers and proceedings.
  origin info:
    place:
      place term: nyu
    place:
      place term: New York
    place:
      place term: Piscataway, NJ
    publisher: IEEE
    publisher: May be ordered from IEEE Service Center
    date issued: ©1992
    date issued: 1992
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: xxv, 715 pages : illustrations ; 28 cm
  note: "Sponsors: IEEE Instrumentation and Measurement Society, IEEE North Jersey Section, IEEE NY/NJ/LI I & M Chapter"--Cover.
  note: "IEEE catalog no. 92CH31518."
  note: Also available via the World Wide Web with additional title: Instrumentation and measurement technology conference, 1992, IMTC '92, 9th IEEE.
  note: Includes bibliographical references.
  subject:
    topic: Engineering instruments
    genre: Congresses
  subject:
    topic: Electronic instruments
    genre: Congresses
  subject:
    topic: Electronic measurements
    genre: Congresses
  subject:
    topic: Ingénierie
    topic: Instruments
    genre: Congrès
  subject:
    topic: Appareils électroniques
    genre: Congrès
  subject:
    topic: Mesures électroniques
    genre: Congrès
  subject:
    topic: Electronic instruments
  subject:
    topic: Electronic measurements
  subject:
    topic: Engineering instruments
  classification: TA165 .I34 1992
  classification: 621.3
  related item:
    title info:
      title: IEEE Instrumentation and Measurement Technology Conference
    name:
      name part: IEEE Instrumentation and Measurement Technology Conference (1992 : New York Metropolitan Area).
    origin info:
      publisher: New York, NY : IEEE ; Piscataway, NJ : Additional copies may be ordered from IEEE Service Center, ©1992
    identifier: (OCoLC)714799787
  identifier: 0780306406
  identifier: 9780780306400
  identifier: 0780306414
  identifier: 9780780306417
  identifier: 0780306422
  identifier: 9780780306424
  identifier: 92053842
  identifier: http://ieeexplore.ieee.org/servlet/opac
  identifier: http://www.ieeexplore.ieee.org/servlet/opac
  related item:
    location:
      url: http://ieeexplore.ieee.org/servlet/opac
  related item:
    location:
      url: http://www.ieeexplore.ieee.org/servlet/opac
  record info:
    record content source: DLC
    record creation date: 920326
    record change date: 20230714101539.0
    record identifier: in00001091808
    language of cataloging:
      language term: eng