Scanned probe microscopy : Santa Barbara, CA, 1991 /
| Other Authors: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
New York :
American Institute of Physics,
[1992]
|
| Series: | AIP conference proceedings ;
no. 241. |
| Subjects: |
| Item Description: | "DOE CONF-910186"--Title page verso. |
|---|---|
| Physical Description: | x, 563 pages : illustrations ; 25 cm. |
| Bibliography: | Includes bibliographical references and indexes. |
| ISBN: | 0883188163 |