rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Commercial applications of precision manufacturing at the sub-micron level
    sub title: 19-21 November 1991, London, United Kingdom
  name:
    name part: Baker, L. R. (Lionel R.)
  name:
    name part: Sira Communications Ltd
  name:
    name part: American Society for Precision Engineering
  name:
    name part: Institute of Manufacturing Engineers
  name:
    name part: Society of Photo-optical Instrumentation Engineers
  type of resource: text
  genre: bibliography
  genre: conference publication
  origin info:
    place:
      place term: wau
    date issued: 1992
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: x, 237 pages : illustrations ; 28 cm.
  note: Lionel R. Baker, chair/editor ; organized by Sira Communications Ltd. ; cosponsored by SPIE--The International Society for Optical Engineering, American Society for Precision Engineering, The Institute of Manufacturing Engineers.
  note: Includes bibliographical references and index.
  subject:
    topic: Manufacturing processes
    topic: Quality control
    topic: Congresses
  subject:
    topic: Physical measurements
    topic: Industrial applications
    topic: Congresses
  related item:
    title info:
      title: Proceedings of SPIE--the International Society for Optical Engineering ; v. 1573
  identifier: 0819407038
  identifier: 92080024
  record info:
    record content source: SOI
    record creation date: 920420
    record change date: 20150929110817.0
    record identifier: in00001086907