Testability of non-autonomous two dimensional iterative logic array /

Bibliographic Details
Main Author:	Nagumo, Hideo, 1957-
Format:	Thesis eBook
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 1991.
Subjects:	Electric fault location. Logic circuits > Testing. Major electrical engineering.
Online Access:	Link to OAKTrust copy

Description
Item Description:	"Major subject: Electrical Engineering." Typescript (photocopy). Vita.
Physical Description:	xi, 99 leaves : illustrations ; 29 cm. Also available online.
Bibliography:	Includes bibliographical references.