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Yield estimates and comparisons for full custom, standard cell, and gate array design methodologies /

Bibliographic Details
Main Author: Norte, Marcella Evelyn, 1966-
Format: Thesis eBook
Language:English
Published: [Place of publication not identified] : [publisher not identified] ; 1990.
Subjects:
Integrated circuits > Very large scale integration > Defects > Mathematical models.
Integrated circuits > Very large scale integration > Design and construction > Mathematical models.
Major electrical engineering.
Online Access:Link to OAKTrust copy
Description
Item Description:"Major subject: Electrical Engineering."
Typescript (photocopy).
Vita.
Physical Description:ix, 75 leaves : illustrations ; 29 cm.
Also available online.
Bibliography:Includes bibliographical references.