Analytical techniques for the characterization of compound semiconductors : proceedings of symposium D on analytical techniques for the characterization of compound semiconductors of the 1990 E-MRS fall conference, Strasbourg, France, November 27-30, 1990 /

Bibliographic Details
Corporate Author:	European Material Research Society (E-MRS) Symposium on "Analytical Techniques for the Characterization of Compound Semiconductors"
Other Authors:	Bastard, Gerald, Oppolzer, Helmut
Format:	Conference Proceeding Book
Language:	English
Published:	Amsterdam ; New York : North-Holland, 1991.
Series:	European Materials Research Society symposia proceedings ; v. 21.
Subjects:	Semiconductors > Analysis > Congresses. Semiconductors > Optical properties > Congresses.

Description
Item Description:	"European Material Research Society (E-MRS) Symposium on "Analytical Techniques for the Charaterization of Compound Semiconductors" held in Strasbourg (France) from November 29 to December 3, 1990."--Pref.
Physical Description:	xvi, 537 pages : illustrations ; 27 cm.
Bibliography:	Includes bibliographical references and indexes.
ISBN:	044489196X