Proceedings of the ... International Conference on Microelectronic Test Structures /

Proceedings International Test Conference 2003 : [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA /
Published: (2003)

Proceedings of the 1991 International Symposium on Microelectronics /
Published: (1991)

Proceedings : International Test Conference 1996.
Published: (1996)

Proceedings : International Test Conference 1994.
Published: (1994)

Proceedings : International Test Conference 1997.
Published: (1997)

Developments in integrated circuit testing /
Published: (1987)

The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985 /
Published: (1985)

Proceedings : International Test Conference 1991, [October 26-30, 1991, Opryland Hotel, Nashville, TN] /
Published: (1991)

Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980 /
Published: (1980)

New frontiers in testing : International Test Conference, 1988, proceedings : September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC /
Published: (1988)

Integration of test with design and manufacturing : International Test Conference, 1987, proceedings, September 1, 2, 3, 1987 /
Published: (1987)

Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 /
Published: (1986)

Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 /
Published: (1983)

Proceedings of the ... IEEE VLSI Test Symposium : VTS.

Proceedings of the 1992 International Symposium on Microelectronics : October 19-21, 1992, Moscone Center, San Fransisco, California /
Published: (1992)

Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.
by: Bahukudumbi, Sudarshan
Published: (2010)

Proceedings of the 1988 International Symposium on Microelectronics : October 17-19 1988, Washington State Convention and Trade Center, Seattle, Washington /
Published: (1988)

The changing philosophy of test : International Test Conference ,1990 proceedings, September 10-14, 1990, Sheraton Washington Hotel, Washington, DC /
Published: (1990)

Meeting the tests of time : International Test Conference, 1989 proceedings, August 29-31, 1989, Sheraton Washington Hotel, Washington, DC /
Published: (1989)

Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981 /
Published: (1981)

Proceedings : International Test Conference 1995.
Published: (1995)

Microelectronics manufacturing, yield, and reliability : 20-21 October 1994, Austin, Texas /
Published: (1994)

Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits.

Process and device modeling for microelectronics /
Published: (1993)

IEEE VLSI Test Symposium : digest of papers.
Published: (1990)

Introduction to digital board testing /
by: Bennetts, R. G.
Published: (1982)

Microelectronics.

Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /
Published: (2008)

The three faces of test : design, characterization, production : proceedings /
Published: (1984)

Digital circuit testing : a guide to DFT and other techniques /
by: Wang, Francis C.
Published: (1991)

An introduction to mixed-signal IC test and measurement /
by: Burns, Mark, 1962-
Published: (2001)

Hybrid microelectronic technology /
by: Moran, Peter, 1948-
Published: (1984)

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
by: Bushnell, Michael L. (Michael Lee), 1950-
Published: (2000)

27th International Symposium on Microelectronics : 15-17 November 1994, Boston, Massachusetts /
Published: (1994)

Analog and mixed-signal test /
Published: (1998)

Thermal testing of integrated circuits /
by: Altet, Josep
Published: (2002)