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Proceedings of the ... International Conference on Microelectronic Test Structures /

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Bibliographic Details
Previous Title:IEEE International Conference on Microelectronic Test Structures. Proceedings of the ... IEEE International Conference on Microelectronic Test Structures
Corporate Authors: IEEE International Conference on Microelectronic Test Structures, IEEE Electron Devices Society, Institution of Electrical Engineers
Format: Conference Proceeding
Language:English
Published: New York, N.Y. : Institute of Electrical and Electronics Engineers, 1989-
Subjects:
Integrated circuits > Testing > Congresses.
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Description
Published:1989-
Physical Description:volumes : illustrations ; 30 cm.
Also available by subscription, in PDF format, via the World Wide Web.
Publication Frequency:Annual
ISSN:1071-9032