Cover Image

Proceedings : International Test Conference 1991, [October 26-30, 1991, Opryland Hotel, Nashville, TN] /

Bibliographic Details
Corporate Authors: International Test Conference Nashville, Tenn., IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: Altoona, Pa. : International Test Conference, [1991]
Subjects:
Integrated circuits > Testing > Congresses.
Electronic digital computers > Circuits > Testing > Congresses.
Description
Item Description:Conference theme: Test: faster, better, sooner.
"IEEE catalog number 91CH3032-0."
Physical Description:xiv, 1135 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographies and index.
ISBN:0780302427 (library binding)
0818661569 (microfiche)
0818691565 (hard)