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EUV, x-ray, and gamma-ray instrumentation for astronomy II : 24-26 July 1991, San Diego, California /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, International Symposium on Optical and Optoelectronic Applied Sciences and Engineering
Other Authors: Siegmund, Oswald H. W., Rothschild, Richard E., 1943-
Format: Conference Proceeding Book
Language:English
Published: Bellingham, Wash. : SPIE, [1991]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 1549.
Subjects:
Astronomical instruments > Congresses.
Nuclear counters > Congresses.
X-ray spectroscopy > Congresses.
Gamma ray spectrometry > Congresses.
Ultraviolet spectrometry > Congresses.
Astronautics in astronomy > Congresses.
Description
Physical Description:x, 440 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819406775 (pbk.)