rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Selected papers on speckle metrology
  title info:
    title: Speckle metrology
  name:
    name part: Sirohi, R. S.
  name:
    name part: Society of Photo-optical Instrumentation Engineers
  type of resource: text
  genre: bibliography
  origin info:
    place:
      place term: wau
    date issued: 1991
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: xviii, 668 pages : illustrations ; 28 cm.
  note: Rajpal S. Sirohi, editor.
  note: "A publication of SPIE--the International Society for Optical Engineering."
  note: Includes bibliographical references and indexes.
  subject:
    topic: Speckle metrology
  subject:
    topic: Holographic interferometry
  classification: TA1555 .S45 1991
  classification: 681/.2
  related item:
    title info:
      title: SPIE milestone series ; v. MS 35
  identifier: 0819406384 (hardbound)
  identifier: 0819406392 (softbound)
  identifier: 91017832
  record info:
    record content source: DLC
    record creation date: 910418
    record change date: 20150928150950.0
    record identifier: in00001038173