Cover Image

Elasto-plastic analysis of the peel test /

Bibliographic Details
Main Author: Kim, Kyung-Suk
Corporate Author: University of Illinois at Urbana-Champaing. Department of Theoretical and Applied Mechanics
Format: Book
Language:English
Published: [Urbana, Ill.] : Dept. of Theoretical and Applied Mechanics, University of Illinois at Urbana-Champaign, [1985]
Series:T. & A.M. report ; no. 472.
Subjects:
Thin films.
Metallic films.
Elastoplasticity.
Description
Item Description:Cover title.
Project number: IBM peel test (441614).
"March 1985."
Physical Description:79 pages : illustrations ; 28 cm.