Cover Image

High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A. /

Bibliographic Details
Corporate Author: Materials Research Society
Other Authors: Sinclair, Robert, Smith, David J., 1948-, Dahmen, Ulrich
Format: Book
Language:English
Published: Pittsburgh, Pa. : Materials Research Society, [1990]
Series:Materials Research Society symposia proceedings.
Subjects:
Materials > Microscopy > Congresses.
Materials > Defects > Congresses.
Electron microscopy > Congresses.
Description
Physical Description:xi, 391 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and indexes.
ISBN:1558990720
ISSN:0272-9172 ;