Materials Research Society, Sinclair, R., Smith, D. J., & Dahmen, U. (1990). High resolution electron microscopy of defects in materials: Symposium held April 16-18, 1990, San Francisco, California, U.S.A. Materials Research Society.
Chicago Style (17th ed.) CitationMaterials Research Society, Robert Sinclair, David J. Smith, and Ulrich Dahmen. High Resolution Electron Microscopy of Defects in Materials: Symposium Held April 16-18, 1990, San Francisco, California, U.S.A. Pittsburgh, Pa.: Materials Research Society, 1990.
MLA (9th ed.) CitationMaterials Research Society, et al. High Resolution Electron Microscopy of Defects in Materials: Symposium Held April 16-18, 1990, San Francisco, California, U.S.A. Materials Research Society, 1990.
Warning: These citations may not always be 100% accurate.