Cover Image

Properties of silicon.

Bibliographic Details
Corporate Author: INSPEC (Information service)
Format: Book
Language:English
Published: London ; New York : INSPEC, Institution of Electrical Engineers, [1988]
Series:EMIS datareviews series ; no. 4.
Subjects:
Silicon.
Description
Physical Description:xxv, 1100 pages ; 29 cm.
Bibliography:Includes bibliographies and index.
ISBN:0852964757