Properties of amorphous silicon.

Bibliographic Details
Corporate Author: INSPEC (Information service)
Format: Book
Language:English
Published: London ; New York : INSPEC, the Institution of Electrical Engineers, [1989]
Edition:2nd ed.
Series:EMIS datareviews series ; no. 1.
Subjects:
Description
Physical Description:xxii, 656 pages ; 29 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0852964803