Industrial laser interferometry II : 27-28 June 1988, Dearborn, Michigan /
| Corporate Authors: | , , |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
[1988]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 955. |
| Subjects: |
| Physical Description: | vi, 163 ; 28 cm. |
|---|---|
| Bibliography: | Includes bibliographical references. |
| ISBN: | 0892529903 |