Desorption induced by keV molecular and cluster projectiles /

Desorption mass spectrometry : are SIMS and FAB the same? /
Published: (1985)

Desorption mass spectrometry : are SIMS and FAB the same? : developed from a symposium sponsored by 3M, the National Science Foundation Midwest Center for Mass Spectrometry at the University of Nebraska--Lincoln, and the National Science Foundation Regional Facility for Surface Analysis at the University of Minnesota, St. Paul, Minnesota, Oct. 7-10, 1984 /
Published: (1985)

Ion formation from organic solids (IFOS V) : proceedings of the fifth international conference, Lövånger, Sweden, June 18-21, 1989 /
Published: (1990)

Ion formation from organic solids (IFOS IV) : mass spectrometry of involatile material : proceedings of the fourth international conference, Münster, Federal Republic of Germany, September 21-23, 1987 /
Published: (1989)

Ion formation from organic solids : proceedings of the second international conference, Munster, Fed. Rep. of Germany, September 7-9, 1982 /
Published: (1983)

Ion-induced electron emission from crystalline solids /
by: Kudō, Hiroshi, 1947-
Published: (2002)

Secondary ion mass spectroscopy of solid surfaces /
by: Cherepin, Valentin Tikhonovich
Published: (1987)

A Low energy nitrogen ion beam /
by: Prince, R. H.
Published: (1965)

Proceedings of the Symposium on Electron and Ion Beam Science and Technology.
Published: (1976)

Characterization of ion desorption and decay in ²⁵²Cf plasma desorption mass spectrometry /
by: Mudgett, Paul David
Published: (1991)

A velocity modulated time-of-flight mass spectrometer /
by: Mills, R. M.
Published: (1963)

Initial kinetic energy of secondary ions desorbed by ²⁵²Cf fission fragments /
by: Jacobs, David Lee
Published: (1988)

New trends and potentialities of ToF-SIMS in surface studies /
by: Grams, Jacek
Published: (2007)

Secondary ion mass spectrometry, SIMS-II : proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979 /
Published: (1979)

Secondary ion mass spectrometry : SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985 /
Published: (1986)

Chemical analysis via heavy ion induced x-ray emission /
by: Cross, Joseph Benjamin
Published: (1976)

Low-energy ion irradiation of solid surfaces /
by: Gnaser, Hubert, 1953-
Published: (1999)

The role of the substrate in ion formation produced by fast heavy ion induced desorption /
by: Nord, Randall Francis
Published: (1991)

Mass spectrometric analysis with cluster projectiles and coincidence counting /
by: Cox, Bedford Dwain, 1966-
Published: (1992)

Ion formation from organic solids (IFOS III) : mass spectrometry of involatile material : proceedings of the third international conference, Munster, Fed. Rep. of Germany, September 16-18, 1985 /
Published: (1986)

Surface mapping based on the correlated emission of ions and electrons from hypervelocity C₆₀ impacts /
by: Eller, Michael J.
Published: (2013)

High performance ²⁵²Cf plasma desorption mass spectrometry /
by: McIntire, Thomas Shane
Published: (1991)

Cf-252 particle desorption mass spectrometry of polymer surfaces /
by: Quinones Maeso, Leticia, 1962-
Published: (1989)

Helium ion microscopy /
Published: (2016)

Development of a heavy-ion identification method using a combined time-of-flight [delta]E-E technique /
by: Hanus, Roy Gene
Published: (1976)

Secondary ion mass spectrometry : a practical handbook for depth profiling and bulk impurity analysis /
by: Wilson, Robert G.
Published: (1989)

Cluster secondary ion mass spectrometry : principles and applications /
by: Mahoney, Christine M., 1975-
Published: (2013)

Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications, and trends /
by: Benninghoven, A.
Published: (1987)

Secondary ion mass spectrometry : principles and applications /
Published: (1989)

Ion surface interaction, sputtering and related phenomena /
Published: (1973)

Desorption induced by electron transitions : DIET I : proceedings of the first international workshop, Williamsburg, Virginia, USA, May 12-14, 1982 /
Published: (1983)

Interaction of atomic particles with a solid surface /
by: Arifov, U. A. (Ubaĭ Arifovich)
Published: (1969)

Secondary Ion Mass Spectrometry SIMS IV : Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983 /
by: Benninghoven, A.
Published: (1984)

Laser ablation and desorption /
Published: (1998)

Heavy ion accelerator technology : eighth international conference : Argonne, Illinois, October 1998 /
Published: (1999)

Double coincidence studies of molecular dissociation induced by heavy ion impact /
by: Sampoll Ramirez, Gabriel, 1962-
Published: (1992)