Atom-probe field ion microscopy : field ion emission and surfaces and interfaces at atomic resolution /

Bibliographic Details
Main Author: Tsong, Tien Tzou, 1934-
Format: Book
Language:English
Published: Cambridge ; New York : Cambridge University Press, 1990.
Subjects:
Description
Physical Description:x, 387 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0521363799