Electron microscopy of plant pathogens /

Bibliographic Details
Corporate Author: International Symposium Electron Microscopy Applied in Plant Pathology
Other Authors: Mendgen, K. (Kurt), 1944-, Lesemann, D.-E. (Dietrich-Eckhardt), 1939-
Format: Conference Proceeding Book
Language:English
Published: Berlin ; New York : Springer-Verlag, [1991]
Subjects:
Description
Item Description:Results of the International Symposium Electron Microscopy Applied in Plant Pathology, held at the University of Konstanz in September 1989.
Physical Description:336 pages : illustrations
Bibliography:Includes bibliographical references and index.
ISBN:354052777X
038752777X (U.S.)