Secondary ion mass spectrometry : principles and applications /

Secondary ion mass spectrometry, SIMS-II : proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979 /
Published: (1979)

Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 /
Published: (1984)

Secondary ion mass spectrometry : SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985 /
Published: (1986)

Secondary ion mass spectroscopy of solid surfaces /
by: Cherepin, Valentin Tikhonovich
Published: (1987)

Secondary ion mass spectrometry : an introduction to principles and practices /
by: Van der Heide, Paul, 1962-
Published: (2014)

Ion mobility spectrometry-mass spectrometry : theory and applications /
Published: (2011)

Desorption mass spectrometry : are SIMS and FAB the same? /
Published: (1985)

Desorption mass spectrometry : are SIMS and FAB the same? : developed from a symposium sponsored by 3M, the National Science Foundation Midwest Center for Mass Spectrometry at the University of Nebraska--Lincoln, and the National Science Foundation Regional Facility for Surface Analysis at the University of Minnesota, St. Paul, Minnesota, Oct. 7-10, 1984 /
Published: (1985)

Practical aspects of trapped ion mass spectrometry.
Published: (2010)

Secondary ion mass spectrometry, SIMS-II : proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979 /
Published: (1979)

Quadrupole ion trap mass spectrometry /
by: March, Raymond E.
Published: (2005)

Ion cyclotron resonance spectrometry /
by: Lehman, Thomas A., 1939-
Published: (1976)

Ion cyclotron resonance spectrometry /
Published: (1978)

Mass spectrometry : principles and applications /
by: Hoffmann, Edmond de
Published: (2007)

Mass spectrometry/mass spectrometry : techniques and applications of Tandem mass spectrometry /
by: Busch, Kenneth L.
Published: (1988)

New trends and potentialities of ToF-SIMS in surface studies /
by: Grams, Jacek
Published: (2007)

Application of coincidence ion mass spectrometry for chemical and structural analysis at the sub-micron scale /
by: Balderas, Sara, 1977-
Published: (2005)

Ion cyclotron resonance spectrometry II /
Published: (1982)

Practical aspects of ion trap mass spectrometry /
Published: (1995)

Mass spectrometry : principles and applications.
by: Hoffmann, Edmond de
Published: (2002)

Secondary ion mass spectrometry, SIMS-III : proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30-September 5, 1981 /
Published: (1982)

Mass spectrometry of organic ions.
by: McLafferty, Fred W.
Published: (1963)

Assigning structures to ions in mass spectrometry /
by: Holmes, John L. (John Leonard), 1931-
Published: (2007)

High performance mass spectrometry : chemical applications : a symposium /
Published: (1978)

Plasma source mass spectrometry /
Published: (1990)

Mass spectrometry : instrumentation, interpretation, and applications /
Published: (2009)

Mass spectrometry /
Published: (1979)

Mass spectrometry /
by: Constantin, E.
Published: (1990)

The encyclopedia of mass spectrometry.
Published: (2015)

Medical applications of mass spectrometry /
Published: (2008)

Mass spectrometry /
by: Davis, Reg
Published: (1987)

Direct analysis in real time mass spectrometry : principles and practices of DART-MS /
Published: (2018)

Mass spectrometry : a textbook /
by: Gross, J. H.
Published: (2004)

Mass spectrometry of organic ions /
Published: (1963)

Rapid communications in mass spectrometry : RCM.
Published: (1987)

Mass spectrometry /
by: Maccoll, A. (Allan)
Published: (1972)