Cover Image

Semiconductor material and device characterization /

Show other versions (3)
Bibliographic Details
Main Author: Schroder, Dieter K.
Format: Book
Language:English
Published: New York : Wiley, [1990]
Subjects:
Semiconductors.
Semiconductors > Testing.
Description
Item Description:"A Wiley-Interscience publication."
Physical Description:xv, 599 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0471511048