rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Surface characterization and testing II
    sub title: 10-11 August 1989, San Diego, California
  name:
    name part: Greivenkamp, John E.
  name:
    name part: Young, Matt
    name part: 1941-
  name:
    name part: Society of Photo-optical Instrumentation Engineers
  name:
    name part: New Mexico State University
    name part: Applied Optics Laboratory.
  type of resource: text
  genre: bibliography
  genre: conference publication
  origin info:
    place:
      place term: wau
    date issued: 1989
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: vi, 271 pages : illustrations ; 28 cm.
  note: John E. Greivenkamp, Matt Young, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University.
  note: Includes bibliographical references and index.
  subject:
    topic: Surfaces (Technology)
    topic: Testing
    topic: Congresses
  subject:
    topic: Surfaces (Technology)
    topic: Optical properties
    topic: Congresses
  classification: TA418.7 .S794 1989
  classification: 620/.44
  related item:
    title info:
      title: Proceedings of SPIE--the International Society for Optical Engineering ; v. 1164
  identifier: 0819402001
  identifier: 89043274
  record info:
    record content source: DLC
    record creation date: 890818
    record change date: 20150927113322.0
    record identifier: in00000978479