Advanced x-ray/EUV radiation sources and applications : 11-13 July 1990, San Diego, California /
| Corporate Authors: | , |
|---|---|
| Other Authors: | , |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
[1990]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 1345. |
| Subjects: | |
| Online Access: | https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/1345.toc |
| Item Description: | "Part of a three-conference program on x-ray and EUV technologies held at the SPIE's International Symposium on Optical and Optoelectronic Applied Science and Engineering, 8-13 July 1990, San Diego, California."--P. v. |
|---|---|
| Physical Description: | vii, 289 pages : illustrations ; 28 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0819404063 (pbk.) |