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Test and evaluation of infrared detectors and arrays /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, New Mexico State University. Applied Optics Laboratory
Other Authors: Hoke, Forney M.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1989]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 1108.
Subjects:
Infrared detectors > Testing > Congresses.
Array processors > Testing > Congresses.
Infrared technology > Congresses.
Description
Item Description:At head of title: Proceedings / SPIE--the International Society for Optical Engineering.
"27-29 March 1989, Orlando, Florida."
Physical Description:vi, 306 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographies and author index.
ISBN:0819401447