Cover Image

Microprobe/SEM.

Bibliographic Details
Corporate Author: National Institute of Standards and Technology (U.S.)
Format: Government Document Book
Language:English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, [1989?]
Series:Standard reference materials.
Subjects:
Scanning electron microscopes > Standards.
Description
Item Description:Shipping list number: 89-150-P.
Physical Description:1 folded sheet (6 pages) : illustrations ; 28 cm.