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Secondary ion mass spectrometry : a practical handbook for depth profiling and bulk impurity analysis /

Bibliographic Details
Main Author: Wilson, Robert G.
Other Authors: Stevie, F. A., Magee, C. W.
Format: Book
Language:English
Published: New York : Wiley, [1989]
Subjects:
Secondary ion mass spectrometry.
Description
Item Description:"A Wiley-Interscience publication."
Physical Description:1 volume (various pagings) : illustrations ; 26 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0471519456