EUV, x-ray, and gamma-ray instrumentation for astronomy and atomic physics : 7-11 August 1989, San Diego, California /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, New Mexico State University. Applied Optics Laboratory
Other Authors: Hailey, Charles J., Siegmund, Oswald H. W.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, 1989.
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 1159.
Subjects:
Description
Item Description:Sponsored by SPIE--the International Society for Optical Engineering; cooperating organizations, Applied Optics Laboratory, New Mexico State University, and others.
Physical Description:x, 680 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819401951