rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Accelerated testing
    sub title: statistical models, test plans and data analysis
  name:
    name part: Nelson, Wayne
    name part: 1936-
    role:
      role term: creator
  type of resource: text
  genre: bibliography
  origin info:
    place:
      place term: nyu
    date issued: 1990
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: xiv, 601 pages : illustrations ; 25 cm.
  note: Wayne Nelson.
  note: "A Wiley-Interscience publication."
  note: Includes bibliographical references (pages 561-577) and index.
  subject:
    topic: Failure time data analysis
  subject:
    topic: Reliability (Engineering)
    topic: Statistical methods
  subject:
    topic: Accelerated life testing
    topic: Statistical methods
  classification: QA276 .N45 1990
  classification: 519.5
  related item:
    title info:
      title: Wiley series in probability and mathematical statistics
      part name: Applied probability and statistics
  identifier: 0471522775
  identifier: 89024853
  record info:
    record content source: DLC
    record creation date: 890915
    record change date: 20150924143007.0
    record identifier: in00000911763