Cover Image

Sixth annual IEEE Semiconductor thermal and Temperature Measurement Symposium : February 6-8, 1990, Sunburst Resort Hotel, Scottsdale, AZ USA.

Bibliographic Details
Corporate Authors: IEEE Semiconductor Thermal and Temperature Measurement Symposium Scottsdale, Ariz., IEEE Components, Hybrids, and Manufacturing Technology Society
Format: Conference Proceeding Book
Language:English
Published: New York, NY : Piscataway, NJ : Instittute of Electrical and Electronics Engineers ; Additional copies may be purchased from IEEE Service Center, [1990]
Subjects:
Semiconductors > Thermal properties > Congresses.
Semiconductors > Cooling > Congresses.
Description
Item Description:Sponsored by IEEE Components, Hybrids, and Manufacturing Technology Society.
"IEEE catalog number 90CH 2640-1."
Cover title: 1990 IEEE 6th annual Semiconductor thermal & Temperature Measurement Symposium.
Physical Description:xiv, 146 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references.