Hardening semiconductor components against radiation and temperature /

Bibliographic Details
Other Authors: Dawes, William R.
Format: Book
Language:English
Published: Park Ridge, N.J., U.S.A. : Noyes Data Corp., [1989]
Subjects:
Description
Item Description:"Based on materials prepared for a tutorial short course given at the 1987 IEEE Nuclear and Space Radiation Effects Conference at Snomass, Colorado."
Physical Description:xii, 328 pages : illustrations ; 27 cm.
Bibliography:Includes bibliographical references.
ISBN:0815512120 :