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Applied logistic regression /

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Bibliographic Details
Main Author: Hosmer, David W.
Other Authors: Lemeshow, Stanley
Format: Book
Language:English
Published: New York : Wiley, [1989]
Series:Wiley series in probability and mathematical statistics. Applied probability and statistics.
Subjects:
Regression analysis.
Regression Analysis.
Description
Item Description:"A Wiley-Interscience publication."
Physical Description:xiii, 307 pages : illustrations
Bibliography:Includes bibliographical references and index.
ISBN:0471615536